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Application Of Statistical Dynamical X-ray Diffraction Theory To Defective Semiconductor Heterostructures
Author(s) -
P. K. Shreeman,
R. J. Matyi,
Erik M. Secula,
David G. Seiler,
Rajinder P. Khosla,
Dan Herr,
C. Michael Garner,
Robert McDonald,
Alain C. Diebold
Publication year - 2009
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3251255
Subject(s) - heterojunction , diffraction , dynamical theory of diffraction , semiconductor , dynamical systems theory , scattering , statistical theory , lattice (music) , statistical physics , physics , optics , computer science , condensed matter physics , optoelectronics , quantum mechanics , mathematics , diffraction grating , statistics , acousto optics , acoustics

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