Simulation Study Of Transmission Electron Microscopy Imaging Of Graphene Stacking
Author(s) -
Florence Nelson,
Alain C. Diebold,
R. Hull,
Erik M. Secula,
David G. Seiler,
Rajinder P. Khosla,
Dan Herr,
C. Michael Garner,
Robert McDonald
Publication year - 2009
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3251232
Subject(s) - graphene , materials science , stacking , high resolution transmission electron microscopy , transmission electron microscopy , optoelectronics , bilayer graphene , nanotechnology , nanoelectronics , electron mobility , physics , nuclear magnetic resonance
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