Open AccessUnderstanding the phase images from off-axis electron holography
Author(s) -
David Cooper,
JeanMichel Hartmann,
JeanPaul Barnes,
Amal Chabli,
Erik M. Secula,
David G. Seiler,
Rajinder P. Khosla,
Daniel Herr,
C. Michael Garner,
Robert McDonald,
Alain C. Diebold
Publication year - 2009
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3251231
Subject(s) - electron holography , holography , focused ion beam , materials science , phase (matter) , ion milling machine , optics , semiconductor , electron microscope , electron , noise (video) , optoelectronics , ion , nanotechnology , computer science , artificial intelligence , physics , image (mathematics) , layer (electronics) , quantum mechanics
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