Open AccessTowards synchrotron-based nanocharacterization
Author(s) -
P. Bleuet,
Lucile Arnaud,
X. Biquard,
Peter Cloetens,
Lise Doyen,
P. Gergaud,
Patrick Lamontagne,
Maylis Lavayssière,
JeanSébastien Micha,
O. Renault,
F. Rieutord,
J. Susini,
Olivier Ulrich,
Erik M. Secula,
David G. Seiler,
Rajinder P. Khosla,
Dan Herr,
C. Michael Garner,
Robert McDonald,
Alain C. Diebold
Publication year - 2009
Publication title -
aip conference proceedings
Language(s) - Uncategorized
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3251217
Subject(s) - synchrotron , synchrotron radiation , image resolution , optics , diffraction , resolution (logic) , materials science , nanotechnology , physics , computer science , artificial intelligence
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