Role of copper in light induced minority-carrier lifetime degradation of silicon | Zendy

Hele Savin | Zendy; Marko YliKoski | Zendy; Antti Haarahiltunen | Zendy

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Role of copper in light induced minority-carrier lifetime degradation of silicon

Author(s) -

Hele Savin,

Marko YliKoski,

Antti Haarahiltunen

Publication year - 2009

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.3250161

Subject(s) - degradation (telecommunications) , copper , carrier lifetime , silicon , materials science , boron , oxygen , optoelectronics , metallurgy , chemistry , electronic engineering , organic chemistry , engineering

We investigate the impact of copper on the light induced minority-carrier lifetime degradation in various crystalline silicon materials. We demonstrate here that the presence of neither boron nor oxygen is necessary for the degradation effect. In addition, our experiments reveal that copper contamination alone can cause the light induced minority-carrier lifetime degradation.Peer reviewe

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