Erratum: “Effects of low-temperature-buffer, rf-power, and annealing on structural and optical properties of ZnO/Al2O3(0001) thin films grown by rf-magnetron sputtering” [J. Appl. Phys. 106, 023511 (2009)]
Author(s) -
H. F. Liu,
S. J. Chua
Publication year - 2009
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3238261
Subject(s) - annealing (glass) , materials science , buffer (optical fiber) , sputter deposition , optoelectronics , thin film , sputtering , rf power amplifier , radio frequency , cavity magnetron , condensed matter physics , metallurgy , electrical engineering , nanotechnology , physics , cmos , engineering , amplifier
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