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Near edge x-ray absorption fine structure spectroscopy with x-ray free-electron lasers
Author(s) -
David P. Bernstein,
Yves Acremann,
Andreas Scherz,
Mark H. Burkhardt,
J. Stöhr,
Martin Beye,
W. F. Schlotter,
Torben Beeck,
F. Sorgenfrei,
Annette Pietzsch,
W. Würth,
Alexander Föhlisch
Publication year - 2009
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3236540
Subject(s) - laser , femtosecond , spectroscopy , absorption (acoustics) , x ray , absorption edge , optics , x ray spectroscopy , photon energy , materials science , extended x ray absorption fine structure , absorption spectroscopy , electron , atomic physics , physics , photon , optoelectronics , quantum mechanics , band gap
We demonstrate the feasibility of Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy on solids by means of femtosecond soft x-ray pulses from a free-electron laser (FEL). Our experiments, carried out at the Free-Electron Laser at Hamburg (FLASH), used a special sample geometry, spectrographic energy dispersion, single shot position-sensitive detection and a data normalization procedure that eliminates the severe fluctuations of the incident intensity in space and photon energy. As an example we recorded the {sup 3}D{sub 1} N{sub 4,5}-edge absorption resonance of La{sup 3+}-ions in LaMnO{sub 3}. Our study opens the door for x-ray absorption measurements on future x-ray FEL facilities

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