Open AccessStructural and magnetic phenomena in Ni53Mn25Al22 thin film prepared by rf magnetron sputtering
Author(s) -
V. K. Srivastava,
Saurabh Kumar Srivastava,
Ratnamala Chatterjee,
Govind Gupta,
S. M. Shivprasad,
A. K. Nigam
Publication year - 2009
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3222940
Subject(s) - materials science , ferromagnetism , magnetization , thin film , magnetism , x ray photoelectron spectroscopy , condensed matter physics , magnetic moment , sputter deposition , sputtering , magnetometer , transmission electron microscopy , annealing (glass) , nuclear magnetic resonance , analytical chemistry (journal) , metallurgy , chemistry , magnetic field , nanotechnology , physics , quantum mechanics , chromatography
Magnetic and structural properties of Ni–Mn–Al thin films are investigated. It is demonstrated that the annealed film shows L21 phase at room temperature. Magnetometry measurements reveal that the annealed film is ferromagnetic and a first order transition in magnetization versus temperature measurement confirms that the martensite to austenite transition occurs around room temperature. Transmission electron microscopy measurements confirm that this structural change occurs just below room temperature. The splitting of Mn 2p3/2 level in x-ray photoelectron spectroscopy core level spectra of the annealed Ni–Mn–Al film, confirms that the origin of magnetism is definitely correlated with the local magnetic moment at the Mn atoms
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