Enlarged near-field optical imaging
Author(s) -
Gilles Lérondel,
Ahmad Sinno,
Luc Chassagne,
P. Ruaux,
Aurélien Bruyant,
S. Topçu,
Pascal Royer,
Yasser Alayli
Publication year - 2009
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3200953
Subject(s) - millimeter , birefringence , optics , interferometry , waveguide , materials science , microscopy , optical microscope , microscope , near infrared spectroscopy , near and far field , refractive index , optoelectronics , physics , scanning electron microscope
International audienceMillimeter scale near-field optical microscopy is here reported. It is demonstrated in the near infrared by observing light propagating in an integrated glass waveguide. Enlarged near-field imaging was made possible thanks to the use of a homemade interferometric translation stage with nanometric scale repeatabilities combined with a commercial atomic force microscope. An integrated optical component was used as a representative example of multiscale components requiring large scale highly resolved optical mapping. By imaging stationary waves on a millimeter long range followed by Fourier analysis, an uncertainty of a few 10−4 on the waveguide modes effective index was obtained. While improving the optogeometrical parameter retrieval precision, millimeter scans make the technique sensitive to properties such as birefringence
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