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Resonance control of membrane reflectors with effective index engineering
Author(s) -
Hongjun Yang,
Santhad Chuwongin,
Zexuan Qiang,
Li Chen,
Huiqing Pang,
Zhenqiang Ma,
Weidong Zhou
Publication year - 2009
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3182801
Subject(s) - fano resonance , materials science , optoelectronics , broadband , resonance (particle physics) , narrowband , silicon , optics , layer (electronics) , wavelength , nanotechnology , plasmon , physics , particle physics
We report here broadband membrane reflectors based on Fano resonances in patterned silicon nanomembranes. Resonance control of the reflectors was realized either by partially removing buried oxide layer underneath the device layer or by controlled SiO2 film deposition on top of the devices. Both blueshifts and redshifts were demonstrated with a turning range of 50 nm for a center wavelength of 1550 nm. These results demonstrate practical postprocess means for Fano resonance engineering for both narrowband filters and ultracompact broadband reflectors.

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