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Soft x-ray appearance potential spectroscopy study of NiO and CoO single crystal surfaces
Author(s) -
Yasuo Fukuda,
S. Mochizuki,
N. Sanada
Publication year - 2009
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3160308
Subject(s) - non blocking i/o , xanes , spectral line , materials science , spectroscopy , absorption spectroscopy , x ray photoelectron spectroscopy , analytical chemistry (journal) , single crystal , crystal (programming language) , ion , x ray spectroscopy , crystallography , chemistry , nuclear magnetic resonance , optics , biochemistry , physics , quantum mechanics , catalysis , programming language , organic chemistry , astronomy , chromatography , computer science
Soft x-ray appearance potential spectroscopy (SXAPS) spectra of Ni 2p, Co 2p, and O 1s for NiO and CoO single crystal surfaces have been measured. Two peaks and a shoulder along with two core lines due to 2p3/2 and 2p1/2 are found for a Ni 2p raw spectrum. A Ni 2p metallic edge was observed for the NiO surface sputtered by Ar ions. An O 1s spectrum of NiO exhibits a broad peak between about 522 and 550 eV and the self-deconvoluted spectrum shows five peaks. For the Co 2p spectrum, two core lines due to 2p3/2 and 2p1/2 along with a shoulder are found and the self-deconvoluted spectrum exhibits four peaks. The broad peak is also seen between about 525 and 555 eV for the O 1s spectrum of CoO and the self-deconvoluted spectrum shows four peaks. The features of the self-deconvoluted SXAPS spectra of Ni 2p, Co 2p, and O 1s for NiO and CoO are found to resemble those of the corresponding near edge x-ray absorption fine structure (NEXAFS). The origin of the peaks is discussed to compare the present work with the ...

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