Publisher's Note: “Displacement detection of silicon nanowires by polarization-enhanced fiber-optic interferometry” [Appl. Phys. Lett. 93, 193110 (2008)] | Zendy

AI Assistant Blog Pricing

Publisher's Note: “Displacement detection of silicon nanowires by polarization-enhanced fiber-optic interferometry” [Appl. Phys. Lett. 93, 193110 (2008)]

Details

The content you want is available to Zendy users.Already have an account? Click here. to sign in.