Open AccessPublisher's Note: “Displacement detection of silicon nanowires by polarization-enhanced fiber-optic interferometry” [Appl. Phys. Lett. 93, 193110 (2008)]
Author(s) -
John M. Nichol,
Eric R. Hemesath,
Lincoln J. Lauhon,
Raffi Budakian
Publication year - 2009
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3152591
Subject(s) - interferometry , polarization (electrochemistry) , nanowire , silicon , silicon nanowires , optical fiber , displacement (psychology) , materials science , optics , optoelectronics , physics , chemistry , psychology , psychotherapist
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