Charging and discharging of graphene in ambient conditions studied with scanning probe microscopy | Zendy

Albert Verdaguer | Zendy; M. Cardellach | Zendy; Juan J. SeguraEgea | Zendy; G. M. Sacha | Zendy; J. Moser | Zendy; Mariusz Zdrojek | Zendy; Adrian Bachtold | Zendy; J. Fraxedas | Zendy

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Charging and discharging of graphene in ambient conditions studied with scanning probe microscopy

Author(s) -

Albert Verdaguer,

M. Cardellach,

Juan J. SeguraEgea,

G. M. Sacha,

J. Moser,

Mariusz Zdrojek,

Adrian Bachtold,

J. Fraxedas

Publication year - 2009

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.3149770

Subject(s) - graphene , kelvin probe force microscope , scanning probe microscopy , materials science , microscopy , wafer , relative humidity , analytical chemistry (journal) , adsorption , scanning capacitance microscopy , scanning ion conductance microscopy , scanning electron microscope , nanotechnology , optoelectronics , optics , chemistry , composite material , atomic force microscopy , scanning confocal electron microscopy , thermodynamics , physics , organic chemistry , chromatography

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