z-logo
open-access-imgOpen Access
Noise characterization of a single parameter quantized charge pump
Author(s) -
F. Hohls,
N. Maire,
B. Kaestner,
K. Pierz,
H. W. Schumacher,
R. J. Haug,
Massimo Macucci,
Giovanni Basso
Publication year - 2009
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3140501
Subject(s) - shot noise , noise (video) , plateau (mathematics) , physics , adiabatic process , electron , current (fluid) , voltage , flicker noise , charge (physics) , charge pump , atomic physics , optoelectronics , noise figure , quantum mechanics , computer science , optics , capacitor , mathematics , amplifier , cmos , mathematical analysis , artificial intelligence , detector , image (mathematics) , thermodynamics
The shot noise of a single parameter quantized charge pump is studied. The pumped current can be varied using a control gate. Quantized current plateaus I = ne fp with fp the pumping frequency and e the electron charge are observed. The shot noise is minimal for each current plateau and maximal in between. Interestingly the first expected quantized current plateau at n = 1 is missing for certain control gate voltages. We use the measured shot noise to extract the probabilities for pumping none, one or two electrons at the position of the missing step. These probabilities can be used to characterize the dynamics of the non‐adiabatic pumping process.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom