Toward Rapid Unattended X-ray Tomography of Large Planar Samples at 50-nm Resolution (abstract)
Author(s) -
J. Rudati,
A. Tkachuk,
Jeff Gelb,
G. Hsu,
Ye Chun feng,
R. Pastrick,
Alan Lyon,
David Trapp,
Tobias Beetz,
S. Chen,
Benjamin Hornberger,
Srivatsan Seshadri,
S. Kamath,
X. L. Zeng,
P. Pianetta,
Joy C. Andrews,
S. Brennan,
Yong S. Chu,
Yi Jing,
Michael Feser,
Wu Yun,
Beverly Karplus Hartline,
Renee K. Horton,
Catherine M. Kaicher
Publication year - 2009
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3137873
Subject(s) - synchrotron , optics , brightness , detector , image resolution , physics , tomography , national laboratory , planar , resolution (logic) , x ray detector , synchrotron light source , computer science , artificial intelligence , beam (structure) , computer graphics (images) , storage ring , engineering physics
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