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Characterization of (Pt2 nm/Co0.4 nm)3/Ptx/IrMn7 nm multilayers by tomographic atom probe: On the role of a Pt spacer
Author(s) -
A. Zarefy,
R. Lardé,
L. Lechevallier,
Fabien Cuvilly,
J.M. Le Breton,
V. Baltz,
B. Rodmacq,
B. Diény
Publication year - 2009
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3125527
Subject(s) - atom probe , materials science , crystallography , atom (system on chip) , diffusion , characterization (materials science) , analytical chemistry (journal) , chemistry , microstructure , nanotechnology , physics , chromatography , computer science , embedded system , thermodynamics
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