Conductivity of thick film (cermet) resistors as a function of metallic particle volume fraction
Author(s) -
G. E. Pike
Publication year - 1978
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.31163
Subject(s) - materials science , volume fraction , percolation threshold , resistor , cermet , conductance , conductivity , percolation (cognitive psychology) , condensed matter physics , microstructure , particle (ecology) , composite material , exponent , metal , electrical resistivity and conductivity , physics , ceramic , metallurgy , linguistics , oceanography , philosophy , quantum mechanics , voltage , neuroscience , geology , biology
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom