X-ray dark-field and phase-contrast imaging using a grating interferometer
Author(s) -
Franz Pfeiffer,
Martin Bech,
Oliver Bunk,
Tilman Donath,
B. Henrich,
Philipp Kraft,
Christian Dávid
Publication year - 2009
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3115639
Subject(s) - dark field microscopy , phase contrast imaging , optics , grating , x ray phase contrast imaging , physics , x ray , contrast (vision) , interferometry , medical imaging , transmission (telecommunications) , phase contrast microscopy , computer science , microscopy , telecommunications , artificial intelligence
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