Open AccessErratum: “A comparative analysis of deep level emission in ZnO layers deposited by various methods” [J. Appl. Phys. 105, 013502 (2009)]
Author(s) -
Cheol Hyoun Ahn,
Young Yi Kim,
Dong Chan Kim,
Sanjay Kumar Mohanta,
Hyung Koun Cho
Publication year - 2009
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3112042
Subject(s) - materials science , engineering physics , optoelectronics , nanotechnology , physics
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