Effect of LEO Exposure on Aromatic Polymers Containing Phenylphosphine Oxide Groups
Author(s) -
Kent A. Watson,
S. Ghose,
Peter T. Lillehei,
Joseph G. Smith,
John W. Connell,
Jacob I. Kleiman
Publication year - 2009
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3076842
Subject(s) - phenylphosphine , kapton , polymer , oxide , fluence , materials science , low earth orbit , chemistry , chemical engineering , polymer chemistry , composite material , layer (electronics) , polyimide , organic chemistry , metallurgy , aerospace engineering , ion , satellite , phosphine , engineering , catalysis
As part of the Materials on The International Space Station Experiment (MISSE), aromatic polymers containing phenylphosphine oxide groups were exposed to low Earth orbit for ∼4 years. All of the aromatic polymers containing phenylphosphine oxide groups survived the exposure despite the high fluence of atomic oxygen that completely eroded other polymer films such as Kapton® and Mylar® of comparable or greater thickness. The samples were characterized for changes in physical properties, thermal/optical properties surface chemistry, and surface topography. The data from the polymer samples on MISSE were compared to samples from the same batch of material stored under ambient conditions on Earth. In addition, comparisons were made between the MISSE samples and those subjected to shorter term space flight exposures. The results of these analyses will be presented.
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