Open AccessErratum: “Degradation studies on high-voltage-driven organic light-emitting device using in situ on-operation method with scanning photoelectron microscopy” [Appl. Phys. Lett. 93, 133310 (2008)]
Author(s) -
J. Lee,
Sunyoung Sohn,
H. J. Yun,
Hyun-Chang Shin
Publication year - 2008
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3046541
Subject(s) - in situ , degradation (telecommunications) , materials science , microscopy , optoelectronics , x ray photoelectron spectroscopy , voltage , nanotechnology , chemical engineering , analytical chemistry (journal) , chemistry , optics , physics , computer science , environmental chemistry , engineering , quantum mechanics , telecommunications , organic chemistry
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom