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Nonvolatile multilevel memory effect by resistive switching in manganite thin films
Author(s) -
H. K. Lau,
Chi Wah Leung
Publication year - 2008
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3043801
Subject(s) - manganite , non volatile memory , materials science , thin film , optoelectronics , electrode , resistive random access memory , planar , reading (process) , resistive touchscreen , random access memory , voltage , nanotechnology , computer science , electrical engineering , condensed matter physics , chemistry , physics , computer hardware , engineering , ferromagnetism , computer graphics (images) , political science , law , computer vision
A planar multilevel memory structure is proposed and examined based on the resistive switching phenomenon in La₀.₇Sr₀.₃MnO₃ films with gold electrodes. Through the application of specific voltage pulses, such structures can be driven to well-defined intermediate resistance values. Samples were subjected to repeated switching cycles and prolonged reading processes to examine their durability during operations. Prescribed states of the samples could be retained after 10 000 switching cycles, and such states remained stable upon continuous probing. The proposed structure provides a simple scheme for the implementation of compact and nonvolatile multibit memory devices.Department of Applied PhysicsMaterials Research CentreAuthor name used in this publication: C. W. Leun

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