Secondary electron emission from freely supported nanowires | Zendy

Makoto Suzuki | Zendy; Kazuhiro Kumagai | Zendy; Takashi Sekiguchi | Zendy; Alan M. Cassell | Zendy; Tsutomu Saito | Zendy; Cary Y. Yang | Zendy

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Secondary electron emission from freely supported nanowires

Author(s) -

Makoto Suzuki,

Kazuhiro Kumagai,

Takashi Sekiguchi,

Alan M. Cassell,

Tsutomu Saito,

Cary Y. Yang

Publication year - 2008

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.3032910

Subject(s) - nanowire , secondary emission , materials science , electron , scanning electron microscope , cathode ray , silicon , nanostructure , monte carlo method , secondary electrons , electron beam induced deposition , atomic physics , yield (engineering) , nanotechnology , molecular physics , optoelectronics , scanning transmission electron microscopy , chemistry , composite material , physics , statistics , mathematics , quantum mechanics

We present secondary electron (SE) emission results from freely supported carbon/silicon nitride (Si3N4) hybrid nanowires using scanning electron microscopy. We found that, contrary to bulk materials, the SE emission from insulating or electrically isolated metallic nanowires is strongly suppressed by the penetrating beam. A mechanism of the SE suppression by the positive specimen charging is proposed, which is based on a total emission yield calculation using the Monte Carlo technique. This finding provides an important basis for studying low-energy electron emission from nanostructures under a penetrating electron beam.

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