Direct characterization of focusing light by negative refraction in a photonic crystal flat lens | Zendy

Jie Tian | Zendy; Min Yan | Zendy; Min Qiu | Zendy; Carl G. Ribbing | Zendy; Yazhao Liu | Zendy; Daozhong Zhang | Zendy; Zhi-Yuan Li | Zendy

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Direct characterization of focusing light by negative refraction in a photonic crystal flat lens

Author(s) -

Jie Tian,

Min Yan,

Min Qiu,

Carl G. Ribbing,

Yazhao Liu,

Daozhong Zhang,

Zhi-Yuan Li

Publication year - 2008

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.3027069

Subject(s) - photonic crystal , optics , materials science , slab , lens (geology) , wavelength , optoelectronics , physics , geophysics

We report the experimental measurement of the field distribution of the spot light focused by a two-dimensional photonic crystal flat lens at wavelengths 1.51-1.58 μm. The photonic crystal slab is fabricated on a silicon-on-insulator substrate by the focused-ion-beam direct-milling strategy. We demonstrate the light focusing by the photonic crystal slab through direct observation of the light spot entering into free space at the end facet of the slab lens. The beam profiles as the function of lateral position are measured and the minimal full-width-half-maximum of the beam 1.2 μm (0.77λ) is obtained

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