Contact-resonance atomic force microscopy for viscoelasticity | Zendy

Philip A. Yuya | Zendy; Donna C. Hurley | Zendy; Joseph A. Turner | Zendy

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Contact-resonance atomic force microscopy for viscoelasticity

Author(s) -

Philip A. Yuya,

Donna C. Hurley,

Joseph A. Turner

Publication year - 2008

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.2996259

Subject(s) - cantilever , viscoelasticity , atomic force acoustic microscopy , materials science , non contact atomic force microscopy , polystyrene , conductive atomic force microscopy , nanomechanics , atomic force microscopy , microscopy , calibration , composite material , nanometre , optics , nanotechnology , polymer , magnetic force microscope , physics , magnetization , quantum mechanics , magnetic field

We present a quantitative method for determining the viscoelastic properties of materials with nanometer spatial resolution. The approach is based on the atomic force acoustic microscopy technique that involves the resonant frequencies of the atomic force microscopy cantilever when its tip is in contact with a sample surface. We derive expressions for the viscoelastic properties of the sample in terms of the cantilever frequency response and damping loss. We demonstrate the approach by obtaining experimental values for the storage and loss moduli of a poly(methyl methacrylate) film using a polystyrene sample as a reference material. Experimental techniques and system calibration methods to perform material property measurements are also presented.

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