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Axially graded heteroepitaxy and Raman spectroscopic characterizations of Si1−xGex nanowires
Author(s) -
JeeEun Yang,
WonHwa Park,
CheolJoo Kim,
Zee Hwan Kim,
MoonHo Jo
Publication year - 2008
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2939564
Subject(s) - nanowire , raman spectroscopy , raman scattering , materials science , transmission electron microscopy , axial symmetry , chemical vapor deposition , phonon , germanium , crystal (programming language) , scattering , optoelectronics , molecular physics , silicon , optics , nanotechnology , condensed matter physics , chemistry , geometry , physics , computer science , programming language , mathematics

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