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On the role of surface tensions and process conditions in detachment nanolithography
Author(s) -
Jae Kwan Kim,
Kahp Y. Suh
Publication year - 2008
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2937143
Subject(s) - nanolithography , wetting , silicon , materials science , nanoscopic scale , nanotechnology , dip pen nanolithography , substrate (aquarium) , phase diagram , nanostructure , adhesion , phase (matter) , fabrication , chemistry , composite material , optoelectronics , medicine , oceanography , alternative medicine , organic chemistry , pathology , geology
We report on the role of intrinsic (adhesion force and wettability) and extrinsic (temperature and pressure) conditions to fabricate dense nanoscale patterns in detachment nanolithography. A phase diagram is constructed by using a rigiflex polymeric mold, an organic film, and silicon or gold substrate. Operating conditions in terms of surface tensions and processing parameters are discussed along with comparison of the minimum resolution with a simple theory.

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