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Effects of interface states on the transport properties of all-oxide La0.8Sr0.2CoO3∕SrTi0.99Nb0.01O3 p-n heterojunctions
Author(s) -
F. Y. Bruno,
Javier GarcíaBarriocanal,
Miriam G. Torija,
A. Rivera,
Z. Sefrioui,
Chris Leighton,
C. León,
J. Santamarı́a
Publication year - 2008
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2887905
Subject(s) - heterojunction , materials science , capacitance , quantum tunnelling , oxide , condensed matter physics , relaxation (psychology) , optoelectronics , chemical physics , chemistry , electrode , physics , psychology , social psychology , metallurgy
Electrical transport properties of heteroepitaxial p-n junctions made of La_(0.8)Sr_(0.2)CoO_(3) and SrTi_(0.99)Nb_(0.01)O_(3) were studied. Junctions display highly rectifying current-voltage characteristics over a wide temperature range (20–300 K). Two distinct transport mechanisms are identified: tunneling assisted by interface states at T<130 K and diffusion/recombination at higher temperatures. Capacitance-voltage characteristics are used to determine the junction built-in potential at different frequencies. A capacitance relaxation is found due to charge trapping at interface states. Interface states, which deeply affect transport, are discussed in connection to charge-transfer processes related to the polarity mismatch at the interface

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