Experimental analysis for the effect of dynamic capillarity on stress transformation in porous silicon
Author(s) -
Wei Qiu,
Yilan Kang,
Qiu Li,
Zhenkun Lei,
QingHua Qin
Publication year - 2008
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2838716
Subject(s) - materials science , stress (linguistics) , porous silicon , silicon , raman spectroscopy , transformation (genetics) , coupling (piping) , porous medium , porosity , composite material , optics , metallurgy , chemistry , physics , philosophy , linguistics , biochemistry , gene
The evolution of real-time stress in porous silicon (PS) during drying is investigated using micro-Raman spectroscopy. The results show that the PS sample underwent non-negligible stress when immersed in liquid and suffered a stress impulsion during drying. Such nonlinear transformation and nonhomogeneneous distribution of stress are regarded as the coupling effects of several physical phenomena attributable to the intricate topological structure of PS. The effect of dynamic capillarity can induce microcracks and even collapse in PS structures during manufacture and storage. © 2008 American Institute of Physics.
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