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Etching of lithium niobate using standard Ti indiffusion technique
Author(s) -
Vijay Sivan,
Arnan Mitchell,
Lam Anh Bui,
Anthony S. Holland,
Suresh K. Bhargava,
Timothy Priest
Publication year - 2007
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2821111
Subject(s) - lithium niobate , materials science , wafer , etching (microfabrication) , annealing (glass) , surface roughness , surface finish , engraving , atomic force microscopy , composite material , mineralogy , optoelectronics , optics , nanotechnology , chemistry , layer (electronics) , physics
We present evidence of etching LiNbO3 when annealing two wafers in contact with an intermediate Ti strip. Etched features are characterized qualitatively using atomic force microscopy. The impact of the Ti strip thickness on the depth and roughness of the etched surface is quantified. Etched trenches of similar depths to the original Ti film are achieved with very smooth etched surface.

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