Status of the heavy ion beam probe system in the Large Helical Device
Author(s) -
M. Nishiura,
T. Ido,
A. Shimizu,
Hiroyuki Nakano,
Tomokazu Kato,
Susumu Katō,
Y. Hamada,
V.P. Shevelko,
R.K. Janev,
M. Wada
Publication year - 2008
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.2819323
Subject(s) - physics , large helical device , beam (structure) , atomic physics , ion , ion gun , ion beam , ion beam deposition , plasma , ion source , range (aeronautics) , injector , plasma diagnostics , nuclear physics , optics , materials science , quantum mechanics , composite material , thermodynamics
A heavy ion beam probe (HIBP) system has been installed into the Large Helical Device (LHD) to measure the spatial profile of the plasma potential and density fluctuations. The optimization of the HIBP system, especially the beam injector, is described. The negative ion beam is required for the MeV beam production in a tandem accelerator. A sputter-type heavy negative ion source has been developed as an intense Au^? beam source to produce Au^+ beams with energy in the MeV range. The extraction electrodes and the Einzel lens system of the ion source have been designed taking into account the beam optics, and installed into the real machine. Throughout the plasma diagnostics on LHD experiments, the consumptions of vaporized caesium and gold target are being characterized for practical operations. In addition, the experimental charge fractions are compared with the theoretical fractions for understanding the charge-changing behavior of Au^? ions and optimizing the fraction of Au^+ ions at the exit of the tandem accelerator of the HIBP syste
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