Formation of Si nanocrystallites observed by in situ transmission electron microscopy and their effect on the enhancement of Er photoluminescence in Er-doped SiO2 | Zendy

Naoki Fukata | Zendy; H. Morihiro | Zendy; Ryo Shirakawa | Zendy; K. Murakami | Zendy; Masanori Mitome | Zendy; Yoshio Bando | Zendy

Open Access

Formation of Si nanocrystallites observed by in situ transmission electron microscopy and their effect on the enhancement of Er photoluminescence in Er-doped SiO2

Author(s) -

Naoki Fukata,

H. Morihiro,

Ryo Shirakawa,

K. Murakami,

Masanori Mitome,

Yoshio Bando

Publication year - 2007

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.2817639

Subject(s) - photoluminescence , transmission electron microscopy , annealing (glass) , materials science , doping , erbium , in situ , analytical chemistry (journal) , silicon , ion , electron paramagnetic resonance , scanning electron microscope , nanotechnology , optoelectronics , chemistry , nuclear magnetic resonance , metallurgy , composite material , physics , organic chemistry , chromatography

The formation of Si nanocrystallites (nc-Si) in erbium (Er)-dispersed SiOx (x<=2) films was investigated by in situ annealing while performing transmission electron microscopy measurements. The correlation between the formation of nc-Si and Er ion emissions was also comprehensively investigated by photoluminescence and electron spin resonance measurements. The results showed that the formation of nano-Si region with the suitable size is important for enhancement of Er ion emission

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