Afterglow mode and the new micropulsed beam mode applied to an electron cyclotron resonance ion source | Zendy

L. Maunoury | Zendy; L. Adoui | Zendy; J. P. Grandin | Zendy; F. Noury | Zendy; B. A. Huber | Zendy; E. Lamour | Zendy; C. Prigent | Zendy; J.P. Rozet | Zendy; D. Vernhet | Zendy; P. Lehérissier | Zendy; J. Y. Pacquet | Zendy

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Afterglow mode and the new micropulsed beam mode applied to an electron cyclotron resonance ion source

Author(s) -

L. Maunoury,

L. Adoui,

J. P. Grandin,

F. Noury,

B. A. Huber,

E. Lamour,

C. Prigent,

J.P. Rozet,

D. Vernhet,

P. Lehérissier,

J. Y. Pacquet

Publication year - 2008

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.2812340

Subject(s) - atomic physics , afterglow , ion , beam (structure) , electron cyclotron resonance , ion beam , highly charged ion , ion cyclotron resonance , physics , electron , cyclotron , pulse duration , ion source , materials science , optics , nuclear physics , laser , gamma ray burst , quantum mechanics , astronomy

International audienceAn increasing number of experiments in the field of low energy ion physics (< 25 keV/charge) requires pulsed beams of highly charged ions. Whereas for high-intensity beams (> µA) a pulsed beam chopper, installed downstream to the analyzing dipole, is used. For low-intensity beams (< 100 nA) the ion intensity delivered during the pulse may be increased by operating the ECR discharge in the afterglow mode [1]. This method gives satisfactory results (ie average current during the beam pulse is higher than the current in the CW mode) for high charge state ions. In this paper, we report on results of the afterglow mode for beams of 22Neq+, 36Arq+ and 84Krq+ ions. Furthermore, a new promising “Micro Pulsed Beam” mode will be described with encouraging preliminary results for 84Kr27+ and 36Ar17+ ions

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