Nano-Raman Spectroscopy is Reaching Semiconductors
Author(s) -
R. D. Hartschuh,
N. Lee,
A. Kisliuk,
John F. Maguire,
M. Green,
Mark D. Foster,
A. P. Sokolov,
David G. Seiler,
Alain C. Diebold,
Robert McDonald,
C. Michael Garner,
Dan Herr,
Rajinder P. Khosla,
Erik M. Secula
Publication year - 2007
Publication title -
aip conference proceedings
Language(s) - Uncategorized
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.2799435
Subject(s) - raman spectroscopy , raman scattering , materials science , optics , polarization (electrochemistry) , silicon , coherent anti stokes raman spectroscopy , optoelectronics , spectroscopy , nanoscopic scale , semiconductor , image resolution , near and far field , nano , near field scanning optical microscope , nanotechnology , chemistry , physics , optical microscope , scanning electron microscope , quantum mechanics , composite material
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