SEMPA Imaging for Spintronics Applications
Author(s) -
John Unguris,
Seokhwan Chung,
D. T. Pierce,
David G. Seiler,
Alain C. Diebold,
Robert McDonald,
C. Michael Garner,
Daniel Herr,
Rajinder P. Khosla,
Erik M. Secula
Publication year - 2007
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.2799420
Subject(s) - spintronics , materials science , ferromagnetism , magnetization , magnetic semiconductor , coupling (piping) , nanotechnology , semiconductor , polarization (electrochemistry) , optoelectronics , condensed matter physics , physics , magnetic field , chemistry , quantum mechanics , metallurgy
Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by three examples: 1) exchange coupling of magnetic layers, 2) spin-transfer switching in magnetic nanowires, and 3) the ferromagnetic metal-semiconductor interface.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom