Linewidth Measurement Based on Automatically Matched and Stitched AFM Images | Zendy

Wei Chu | Zendy; Joseph Fu | Zendy; Ronald G. Dixson | Zendy; Theodore V. Vorburger | Zendy; David G. Seiler | Zendy; Alain C. Diebold | Zendy; Robert McDonald | Zendy; C. Michael Garner | Zendy; Dan Herr | Zendy; Rajinder P. Khosla | Zendy; Erik M. Secula | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Linewidth Measurement Based on Automatically Matched and Stitched AFM Images

Author(s) -

Wei Chu,

Joseph Fu,

Ronald G. Dixson,

Theodore V. Vorburger,

David G. Seiler,

Alain C. Diebold,

Robert McDonald,

C. Michael Garner,

Dan Herr,

Rajinder P. Khosla,

Erik M. Secula

Publication year - 2007

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.2799408

Subject(s) - laser linewidth , distortion (music) , rotation (mathematics) , materials science , position (finance) , carbon nanotube , tilt (camera) , optics , sample (material) , standard deviation , image processing , measure (data warehouse) , computer science , acoustics , artificial intelligence , computer vision , image (mathematics) , nanotechnology , physics , optoelectronics , mathematics , geometry , amplifier , laser , statistics , cmos , finance , economics , thermodynamics , database

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research