z-logo
open-access-imgOpen Access
X-ray Reflectivity Measurements of Nanoscale Structures: Limits of the Effective Medium Approximation
Author(s) -
HaeJeong Lee,
Christopher L. Soles,
Shuhui Kang,
Hyun Wook Ro,
Eric K. Lin,
WenLi Wu,
David G. Seiler,
Alain C. Diebold,
Robert McDonald,
C. Michael Garner,
Dan Herr,
Rajinder P. Khosla,
Erik M. Secula
Publication year - 2007
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.2799371
Subject(s) - optics , grating , azimuth , coherence length , coherence (philosophical gambling strategy) , specular reflection , collimated light , metrology , physics , ranging , materials science , laser , telecommunications , superconductivity , quantum mechanics , computer science

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom