X-ray Reflectivity Measurements of Nanoscale Structures: Limits of the Effective Medium Approximation
Author(s) -
HaeJeong Lee,
Christopher L. Soles,
Shuhui Kang,
Hyun Wook Ro,
Eric K. Lin,
WenLi Wu,
David G. Seiler,
Alain C. Diebold,
Robert McDonald,
C. Michael Garner,
Dan Herr,
Rajinder P. Khosla,
Erik M. Secula
Publication year - 2007
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.2799371
Subject(s) - optics , grating , azimuth , coherence length , coherence (philosophical gambling strategy) , specular reflection , collimated light , metrology , physics , ranging , materials science , laser , telecommunications , superconductivity , quantum mechanics , computer science
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom