Off-Specular X-ray and Neutron Reflectometry for the Structural Characterization of Buried Interfaces | Zendy

Kristopher A. Lavery | Zendy; Vivek M. Prabhu | Zendy; Eric K. Lin | Zendy; WenLi Wu | Zendy; Sushil K. Satija | Zendy; Matthew Wormington | Zendy; David G. Seiler | Zendy; Alain C. Diebold | Zendy; Robert McDonald | Zendy; C. Michael Garner | Zendy; Daniel Herr | Zendy; Rajinder P. Khosla | Zendy; Erik M. Secula | Zendy

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Off-Specular X-ray and Neutron Reflectometry for the Structural Characterization of Buried Interfaces

Author(s) -

Kristopher A. Lavery,

Vivek M. Prabhu,

Eric K. Lin,

WenLi Wu,

Sushil K. Satija,

Matthew Wormington,

David G. Seiler,

Alain C. Diebold,

Robert McDonald,

C. Michael Garner,

Daniel Herr,

Rajinder P. Khosla,

Erik M. Secula

Publication year - 2007

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.2799367

Subject(s) - specular reflection , neutron reflectometry , reflectometry , materials science , surface finish , x ray reflectivity , neutron , optics , surface roughness , scattering , characterization (materials science) , neutron scattering , reflectivity , small angle neutron scattering , physics , nanotechnology , composite material , computer science , time domain , quantum mechanics , computer vision

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