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Elucidation of homojunction formation in CuInS2 with impedance spectroscopy
Author(s) -
Ruben Loef,
J. Schoonman,
Albert Goossens
Publication year - 2007
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.2759470
Subject(s) - homojunction , dielectric spectroscopy , materials science , acceptor , spectroscopy , capacitance , charge carrier density , analytical chemistry (journal) , optoelectronics , chemistry , electrode , condensed matter physics , heterojunction , physics , quantum mechanics , doping , chromatography , electrochemistry
Type transformation in CuInSe2 and CuInS2 solar cells is an important issue with far reaching consequences. In the present study, the presence of a p-n homojunction inside CuInS2 in a TiO2/CuInS2 device is revealed with a detailed impedance spectroscopy and capacitance study. A n-type CuInS2 film with a thickness of 40?nm is found at the TiO2 (n-type)/CuInS2 (p-type) interface. The effective donor density of this n-type film is 2×1017?cm?3 at 400?K and is higher than the effective acceptor density in the remaining p-type CuInS2, being 4×1016?cm?3 at 400?K. Both densities decrease upon increasing the temperature. This is explained by the activation of a CuIn? acceptor state in n-type CuInS2 and a thermally activated hole trap in p-type CuInS2.DelftChemTechApplied Science

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