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In situ mask designed for selective growth of InAs quantum dots in narrow regions developed for molecular beam epitaxy system
Author(s) -
Shunsuke Ohkouchi,
Yusui Nakamura,
Naoki Ikeda,
Yoshimasa Sugimoto,
Kiyoshi Asakawa
Publication year - 2007
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.2756624
Subject(s) - molecular beam epitaxy , laser linewidth , materials science , quantum dot , photoluminescence , optoelectronics , epitaxy , in situ , electron diffraction , reflection high energy electron diffraction , optics , diffraction , nanotechnology , laser , chemistry , layer (electronics) , physics , organic chemistry
We have developed an in situ mask that enables the selective formation of molecular beam epitaxially grown layers in narrow regions. This mask can be fitted to a sample holder and removed in an ultrahigh-vacuum environment; thus, device structures can be fabricated without exposing the sample surfaces to air. Moreover, this mask enables the observation of reflection high-energy electron diffraction during growth with the mask positioned on the sample holder and provides for the formation of marker layers for ensuring alignment in the processes following the selective growth. To explore the effectiveness of the proposed in situ mask, we used it to grow quantum dot (QD) structures in narrow regions and verified the perfect selectivity of the QD growth. The grown QDs exhibited high optical quality with a photoluminescence peak at approximately 1.30 µm and a linewidth of 30 meV at room temperature. The proposed technique can be applied for the integration of microstructures into optoelectronic functional devices

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