Submicron-diameter semiconductor pillar microcavities with very high quality factors | Zendy

G. Lecamp | Zendy; J. P. Hugonin | Zendy; Philippe Lalanne | Zendy; Rémy Braive | Zendy; S. Varoutsis | Zendy; S. Laurent | Zendy; A. Lemaı̂tre | Zendy; I. Sagnes | Zendy; G. Patriarche | Zendy; I. Robert-Philip | Zendy; I. Abram | Zendy

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Submicron-diameter semiconductor pillar microcavities with very high quality factors

Author(s) -

G. Lecamp,

J. P. Hugonin,

Philippe Lalanne,

Rémy Braive,

S. Varoutsis,

S. Laurent,

A. Lemaı̂tre,

I. Sagnes,

G. Patriarche,

I. Robert-Philip,

I. Abram

Publication year - 2007

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.2711186

Subject(s) - pillar , materials science , cladding (metalworking) , fabrication , semiconductor , optoelectronics , quality (philosophy) , optics , q factor , quasiperiodic function , condensed matter physics , physics , composite material , resonator , medicine , alternative medicine , structural engineering , pathology , quantum mechanics , engineering

International audiencePillar microcavities are subject to two common fabrication artifacts: Bragg mirror corrugation and oxide deposit cladding. In this letter the authors investigate the impact of these features on the quality factor. A quasiperiodic variation of the quality factor as a function of the pillar diameter is experimentally observed and well described by theory. Moreover, observation of quality factors in excess of 1500, close to the theoretical limit, is reported for 600-nm-diameter GaAs micropillars bounded by AlGaAs/GaAs Bragg mirrors

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