Kinetic study of Al-mole fraction in AlxGa1−xN grown on c-plane sapphire and AlN bulk substrates by metal-organic vapor-phase epitaxy
Author(s) -
Y. Xi,
K. X. Chen,
Frank W. Mont,
J. K. Kim,
W. Lee,
E. Fred Schubert,
W. Liu,
X. Li,
J. Smart
Publication year - 2007
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2437681
Subject(s) - mole fraction , sapphire , epitaxy , metalorganic vapour phase epitaxy , volume fraction , bowing , analytical chemistry (journal) , volumetric flow rate , chemistry , materials science , chemical vapor deposition , growth rate , metal , nanotechnology , thermodynamics , metallurgy , optics , geometry , organic chemistry , laser , philosophy , physics , theology , layer (electronics) , mathematics
A systematic study is performed on the dependence of the Al-mole fraction in AlxGa1−xN on the organometallic group-III precursor flow during metal-organic vapor-phase epitaxy. When keeping the total organometallic volume flow constant, a nonlinear concave bowing relationship is found between the Al-mole fraction (for 0⩽x⩽1) and the relative trimethylaluminum volume flow. A kinetic model, which takes into account the growth rate ratio between GaN and AlN (gGaN∕gAlN), is developed to explain such concave bowing relationship. The experimental data are in excellent agreement with the theoretical model. For AlxGa1−xN growth on AlN bulk substrates, it is found that the Al-mole fraction is smaller and the growth rate ratio is larger than on sapphire substrates. The authors also investigate the incorporation of Al in AlxGa1−xN as a function of the group-III precursor molar flow rate. A positive convex bowing relationship is found between Al-mole fraction and the relative trimethylaluminum molar flow, which is con...
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