Xenon ion beam characterization in a helicon double layer thruster | Zendy

Christine Charles | Zendy; Rod Boswell | Zendy; M. A. Lieberman | Zendy

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Xenon ion beam characterization in a helicon double layer thruster

Author(s) -

Christine Charles,

Rod Boswell,

M. A. Lieberman

Publication year - 2006

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.2426881

Subject(s) - xenon , helicon , beam (structure) , ion beam , atomic physics , ion , plasma , magnetic field , ion thruster , beam divergence , ion beam deposition , electric field , double layer (biology) , materials science , chemistry , layer (electronics) , beam diameter , physics , optics , nuclear physics , nanotechnology , laser beams , laser , organic chemistry , quantum mechanics

A current-free electric double layer is created in a helicon double layer thruster operating with xenon and compared to a recently developed theory. The Xe+ ion beam formed by acceleration through the potential drop of the double layer is characterized radially using an electrostatic ion energy analyzer. For operating conditions of 500W rf power, 0.07mTorr gas pressure, and a maximum magnetic field of 125G, the measured beam velocity is about 6kms−1, the beam area is about 150cm2, and the measured beam divergence is less than 6°.

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