Method based on atomic photoionization for spot-size measurement on focused soft x-ray free-electron laser beams | Zendy

A. A. Sorokin | Zendy; Alexander Gottwald | Zendy; Arne Hoehl | Zendy; U. Kroth | Zendy; Hendrik Schöppe | Zendy; G. Ulm | Zendy; M. Richter | Zendy; S. V. Bobashev | Zendy; I. V. Domracheva | Zendy; D. N. Smirnov | Zendy; K. Tiedtke | Zendy; S. Düsterer | Zendy; J. Feldhaus | Zendy; U. Hahn | Zendy; U. Jastrow | Zendy; M. Kuhlmann | Zendy; T. Núñez | Zendy; Elke Plönjes | Zendy; R. Treusch | Zendy

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Method based on atomic photoionization for spot-size measurement on focused soft x-ray free-electron laser beams

Author(s) -

A. A. Sorokin,

Alexander Gottwald,

Arne Hoehl,

U. Kroth,

Hendrik Schöppe,

G. Ulm,

M. Richter,

S. V. Bobashev,

I. V. Domracheva,

D. N. Smirnov,

K. Tiedtke,

S. Düsterer,

J. Feldhaus,

U. Hahn,

U. Jastrow,

M. Kuhlmann,

T. Núñez,

Elke Plönjes,

R. Treusch

Publication year - 2006

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.2397561

Subject(s) - beamline , photoionization , synchrotron radiation , free electron laser , optics , laser , synchrotron , electron , atomic physics , materials science , beam (structure) , physics , ionization , nuclear physics , ion , quantum mechanics

A method has been developed and applied to measure the beam waist and spot size of a focused soft x-ray beam at the free-electron laser FLASH of the Deutsches Elektronen-Synchrotron in Hamburg. The method is based on a saturation effect upon atomic photoionization and represents an indestructible tool for the characterization of powerful beams of ionizing electromagnetic radiation. At the microfocus beamline BL2 at FLASH, a full width at half maximum focus diameter of (15±2)μm was determined.

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