Open AccessResponse to “Comment on ‘Application of the interface capacitance model to thin-film relaxors and ferroelectrics’” [Appl. Phys. Lett. 89, 196101 (2006)]
Author(s) -
M. Tyunina,
J. Levoska
Publication year - 2006
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2385632
Subject(s) - capacitance , thin film , condensed matter physics , interface (matter) , materials science , ferroelectricity , optoelectronics , engineering physics , nanotechnology , physics , composite material , quantum mechanics , electrode , dielectric , capillary number , capillary action
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