Origin of efficient luminescence from GaN:Eu3+ epitaxial films revealed by microscopic photoluminescence imaging spectroscopy
Author(s) -
Atsushi Ishizumi,
Junji Sawahata,
Katsuhiro Akimoto,
Yoshihiko Kanemitsu
Publication year - 2006
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2385180
Subject(s) - photoluminescence , luminescence , epitaxy , materials science , spectroscopy , photoluminescence excitation , optoelectronics , doping , crystallographic defect , analytical chemistry (journal) , chemistry , crystallography , nanotechnology , physics , layer (electronics) , quantum mechanics , chromatography
We have studied photoluminescence (PL) properties of Eu3+-doped GaN (GaN:Eu3+) epitaxial films by microscopic PL imaging spectroscopy. The GaN:Eu3+ epitaxial films exhibit efficient red luminescence related to intra-4f transitions of Eu3+ ions. The intensity and the spectral shape of the Eu3+-related PL are sensitive to the Eu3+ concentration, the excitation wavelength, and the monitored position. Microscopic PL imaging spectroscopy revealed that efficient red luminescence of GaN:Eu3+ epitaxial films is due to Eu3+ ions around point defects and dislocations
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