Open AccessDielectric water sorption analysis
Author(s) -
M. Giacomelli Pe,
Stephen J. Picken,
Michael Wübbenhorst,
G. de Vos,
J. van Turnhout
Publication year - 2006
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.2370739
Subject(s) - sorption , kapton , materials science , dielectric , coating , capacitance , reproducibility , moisture , desorption , water vapor , polyimide , diffusion , analytical chemistry (journal) , composite material , chemical engineering , adsorption , electrode , optoelectronics , chromatography , chemistry , layer (electronics) , organic chemistry , thermodynamics , physics , engineering
The sorption of water vapor in Kapton (R) (polyimide) films has been investigated with a new method, dielectric sorption analysis (DSA). The technique is based on high-resolution time-resolved capacitance measurements performed during exposure of an organic coating to humidified nitrogen. The basis of the method is described together with experimental details related to the capacitance measurement, long-term stability, reproducibility, and other characteristics of the setup. The technique allows the determination of the sorption/desorption and diffusion characteristics of a coating on a time scale varying from seconds to days. Mass transport properties derived from complementary weight measurements are in good agreement with the DSA results. Real-time monitoring of the moisture sorption in organic coatings demonstrates the potential of the technique in the field of nondestructive coating inspection and testing. (c) 2006 American Institute of Physics.status: publishe
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