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Growth and structure of Pd films on ZnO(0001)
Author(s) -
Parthasarathi Bera,
John M. Vohs
Publication year - 2006
Publication title -
the journal of chemical physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.071
H-Index - 357
eISSN - 1089-7690
pISSN - 0021-9606
DOI - 10.1063/1.2363186
Subject(s) - x ray photoelectron spectroscopy , island growth , electron diffraction , economies of agglomeration , materials science , alloy , electron energy loss spectroscopy , low energy electron diffraction , layer (electronics) , diffraction , spectroscopy , chemical vapor deposition , crystallography , analytical chemistry (journal) , chemistry , chemical engineering , nanotechnology , metallurgy , transmission electron microscopy , optics , physics , epitaxy , quantum mechanics , engineering , chromatography
The growth and structure of Pd films on ZnO(0001) were investigated using high resolution electron energy loss spectroscopy, x-ray photoelectron spectroscopy, and low energy electron diffraction. Vapor deposited Pd films at 300 K were found to follow a two-dimensional (2D) island growth mode, in which 2D metal islands are formed up to a critical coverage at which point growth occurs primarily in a layer-by-layer fashion on top of the islands. Heating to only 350 K was found to be sufficient to induce partial agglomeration of Pd films into three-dimensional particles. In addition to causing further agglomeration into particles, heating to 700 K resulted in partial reduction of the ZnO surface and the formation of a PdZn alloy.

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