Chemistry of Cu deposition by Cu(hfac)(tmvs) monitored by Li+ ion attachment mass spectrometry
Author(s) -
Toshihiro Fujii,
Sundaram Arulmozhiraja,
Megumi Nakamura,
Yoshiro Shiokawa
Publication year - 2006
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.2360768
Subject(s) - chemistry , mass spectrometry , ion , analytical chemistry (journal) , chemical vapor deposition , copper , deposition (geology) , adduct , environmental chemistry , organic chemistry , chromatography , paleontology , sediment , biology
This work was supported in part by The New Energy and Industrial Technology Development Organization NEDO under a fund for Fundamental Technology Research Facilitation Program.
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