Single phase nanocrystalline GaMnN thin films with high Mn content
Author(s) -
Simon Granville,
F. Budde,
B. J. Ruck,
H. J. Trodahl,
G. V. M. Williams,
A. Bittar,
Mary P. Ryan,
J. Kennedy,
A. Markwitz,
James B. Metson,
Katherine Prince,
Julie M. Cairney,
M. C. Ridgway
Publication year - 2006
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.2357701
Subject(s) - extended x ray absorption fine structure , nanocrystalline material , materials science , transmission electron microscopy , analytical chemistry (journal) , thin film , impurity , doping , crystallography , rutherford backscattering spectrometry , nanocrystal , phase (matter) , absorption spectroscopy , spectroscopy , chemistry , nanotechnology , optics , physics , optoelectronics , organic chemistry , chromatography , quantum mechanics
The authors gratefully acknowledge financial support from the New Zealand Foundation for Research Science and Technology through its New Economy Research Fund, and through a postdoctoral fellowship of one of the authors B.J.R.. The work of the MacDiarmid Institute is supported by a New Zealand Centre of Research Excellence award. Another author S.G. wishes to thank Education New Zealand for financial support of the EXAFS measurements.
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